Cantilever probe card

China Cantilever probe card offered by Wuxi Yiyang Semiconductor Company Limited, They are used in IC design, manufacturing, packaging

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Cantilever probes are a corresponding solution for testing requirements such as fine spacing, small size pads, high speed, less cleaning, high number of tests, high pin count and ultra-low leakage. Widely used for gold ball pad and pad testing of display drivers, logic and memory devices

Mixed Signal Vertical Probe Card

China Mixed Signal Vertical Probe Card offered by Wuxi Yiyang Semiconductor Company Limited, They are used in IC design, manufacturing, packaging

SOC IC Vertical Probe Card

China SOC IC Vertical Probe Card offered by Wuxi Yiyang Semiconductor Company Limited, They are used in IC design, manufacturing, packaging